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Molecular-level measurements of wetting properties on solid surfaces and their applications

Oxide film surfaces that are reactive with gas molecules are evaluated by:

・“In-situ” observations with synchrotron radiated light as a probe

・Measurement of electrical characteristics of an electronic device fabricated directly above

Through such measurement, we aim to design a novel device process.

Liquid films observed by electrostatic force microscopy

FTIR study of semiconductor surfaces